Call for Tender: Atomic Force Microscope

Descriptions

The National Facility for Ultra-Precision Surfaces at Glyndwr University St Asaph has a requirement for a new or refurbished Atomic Force Microscope (AFM) suitable for the in-process measurement of machined (ground) and polished surfaces to an accuracy of up to 0.1 nm RMS.The application areas are:•Investigation of microstructure on machined (diamond turned and/or loose abrasive) ceramic and metallic surfaces•Investigation of microstructure on chemical mechanical polished (CMP) and other polished surfaces, both metallic and ceramic•The surfaces may be large and the measurements may be in-process, and so the AFM must be deployable for measurement•The surfaces may be thin and fragile and so there is a maximum tolerable weight for the AFM head•There is a day-one requirement for Kelvin Probe analysis•The AFM will be a shared facility and so must be amenable to upgrade at reasonable cost to increase functionalityThe specification of the atomic force microscope is as follows:1A tripod stand-alone AFM scan head with tip-scanning AFM architecture.2The scan head shall have proven ability to be deployed directly onto large structures (such as lenses/mirrors with diameter of 1 metre or larger) and measure surface roughness in the sub-nm range whilst deployed.3The scan head shall be able to measure surface roughness in the sub-nm range without dedicated vibration isolation for the scan head, assuming the system is operating on an isolated optical bench or equivalent.4The weight of the scan head shall be no greater than 2 kg. There shall be provision for non-metalic contact on the feet of the tripod.5The following operating modes shall be available:a)Imaging: contact mode, intermittent contact and non-contact modes, phase contrast, magnetic/electrostatic force, force modulation, spreading resistance, lateral force. This functionality is a day-one requirement.b)The delivered system shall be capable of performing Kelvin Probe Force Microscopy (KPFM) without the need of an additional lock-in amplifier. This functionality is a day-one requirement.c)Spectroscopy: Force-Distance, Force-Tip voltage, Amplitude-Distance, Phase-Distance, Current-Voltage, Current-Distance.d)Lithography: static force, dynamic force.6The scan head design shall accommodate a large variety of samples and sample holders without restrictions to size, geometry and weight.7The cantilever holder shall support the self-alignment for cantilevers with alignment grooves (to ensure rapid laser alignment).8The scan head shall have integrated or automated cantilever alignment to optimise realignment after replacement of the cantilever.9The available cantilever holders shall support the identified operating modes and be supported as upgrades.10The scanhead shall have an XY scan with a minimum range of no less than 50 µm x 50 µm for imaging with minimal background curvature. We have a goal of a range of 100 µm x 100 µm.11The noise on the XY scan shall have a noise level of no greater than 300pm, with a drive resolution sufficient to deliver noise-limited performance.12The scan head shall have a piezo-based Z-scanner with a scan range of no less than 5 µm, a Z-measurement noise level of no greater than 50 pm, and a drive resolution sufficient to deliver noise-limited performance. We have a goal of a range of 10 µm.13We ask for a minimum of top-down view for aiding sample navigation, useable both with sample in air and immersed in liquid. We ask the supplier to supply a side view for easy approach, or demonstrate that this view is not an operational requirement. Any dual observation shall provide simultaneous display of top-down view and side view.14We ask for an automated approach mode, continuous or step-by-step.15We ask for a USB or equivalent industry standard interface between controller and PC.16We ask for the AFM controller to have fully digital internal data processing, with sufficient ADC/DAC conversion depth not to compromise experimental resolution. Where appropriate, the controller to be programmable to allow high-speed data acquisition, dynamic filtering and analysis, and real-time signal monitoring directly from within the AFM control software.17A Microsoft Windows compatible acquisition and analysis software package with software updates included for the product lifetime.18A micrometer translation stage: no less than 5 mm in each XY direction for sample positioning, repositioning precision better than 10 µm, straight line accuracy better than 10 µm. Our preference is for an XY adjustment range of 10 mm or greater.19Tools and two sets of cantilevers shall be provided (one for contact mode and one for dynamic mode). Minimum number of cantilevers per set is 10.20We identify the following possible upgrade routes:a)We ask that the AFM be capable of performing measurements in liquid with minimum change of configuration. In particular, no significant laser adjustment shall be required upon immersion of cantilever into liquid.b)A dedicated active vibration isolation table.c)A motorized sample stage with at least 20 mm travel in XY, repositioning accuracy of 1 µm or better, and at least 5 mm travel in Z, with a resolution consistent with the repositioning accuracy.d)An additional Z-actuator with 100 µm range and 1 nm resolution or better.e)The system must be compatible with use on inverted microscopes (e.g. Zeiss, Nikon, Olympus, Leica) via an optional microscope stage adapter, with minimum modification to the scan head.NOTE: To register your interest in this notice and obtain any additional information please visit the Sell2Wales Web Site at http://www.sell2wales.gov.uk/Search/Search_Switch.aspx?ID=14272.