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Call for Tender: Atomic Force Microscope
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Descriptions
The National Facility for Ultra-Precision Surfaces at Glyndwr University St Asaph has a requirement for a new or refurbished Atomic Force Microscope (AFM) suitable for the in-process measurement of machined (ground) and polished surfaces to an accura ....see more
Timeline
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Tender Regions
CPV Codes
38514200 - Scanning probe microscopes
38000000 - Laboratory, optical and precision equipments (excl. glasses)
38510000 - Microscopes
38514000 - Darkfield and scanning probe microscopes
38500000 - Checking and testing apparatus
Keywords
optical tools
microscopes
microscopy tools
SPM instruments
measurement device
precision apparatus
light microscopes
spectrometry units
phase contrast analyzers
calibration instruments
tunneling microscopes
laboratory instruments
testing equipment
laboratory testers
sample inspection scopes
atomic force microscopes
optical magnifiers
research lab gear
darkfield microscopes
quality inspection tools
laboratory microscopes
analytical equipment
calibration systems
non-optical microscopy systems
surface scanning instruments
nanostructure imaging systems
surface topology analyzers
magnification instruments
scanning probe microscopes
compliance testing apparatus
fault detection instruments
biological imaging devices
nanotechnology imaging tools
scientific measuring devices
Workflows
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