Awarded
Control Electronics for Scanning Probe Microscopy
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Descriptions
The requirement is for a set of control electronics and software for low temperature scanning tunnelling and atomic force microscopy. The electronics will be used to control a UHV low temperature scanning probe which will combine STM, AFM and scanning SQUID microscopy techniques. This probe will be integrated in the St Andrews molecular beam epitaxy (MBE) laboratory suite.
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CPV Codes
31682210 - Instrumentation and control equipment
Keywords
sensor interface
measurement device
control equipment
process control unit
instrumentation equipment
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