Awarded
Ellipsometer System
Descriptions
An ellipsometer system for measurement of optical parameters of thin films grown on various wafer-like substrates.
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CPV Codes
33113000 - Magnetic resonance imaging equipment
38126100 - Precipitation or evaporation surface observing apparatus
44613210 - Water chambers
42124300 - Parts of air or vacuum pumps, of air or gas compressors
31712330 - Semiconductors
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Possible Competitors
1 Possible Competitors