LA1818C - Supply, Delivery, Installation and Commissioning of a Benchtop Scanning Electron Microscope for MiCRA Enterprise Ireland Technology Gateway, Technology University Dublin, Tallaght (TUD)

Descriptions

Summary of requirements A benchtop scanning electron microscope with a low equipment footprint, capable of • High resolution magnifications of at least 100k X • Holding samples of up to 100 mm and larger in size. • EDS or EDX analysis for elemental mapping in variable pressure environments. • Providing 3D and large area imaging and live video. Some potential applications include: • Examining particle morphology and shape • Examining surface features • Imaging and Identification of contaminants (e.g. spots on a tablet) • Measuring sample elemental composition and mapping elemental distribution • Samples to be tested would include metallurgical samples, powders, thin films, microneedle arrays, solid dosage forms (e.g. tablets) and drug-coated substrates (e.g. stents or catheters). The SEM system should be flexible and allow for purchase of additional functionality (hardware and software) at a later date to keep up-to-date with developments in the field.