Awarded
LEE638C - TCD - RFT for new Analyser, X-ray Source and Argon Gun for an existing XPS System (ESCALAB MK II)
Descriptions
An x-ray source, analyser and argon gun to be used in an XPS System (ESCALAB MK II). This will enable SFI funded, materials science research in AMBER CRANN at Trinity College Dublin. The XPS technique is unique as it allows highly surface sensitive analysis of broad range of materials. Specifically, the research carried out will be in characterising the surface chemistry of materials. XPS can be used to measure elemental composition, chemical and electronic states, empirical formula of the elements within a material. This is achieved by irradiating the surface using an x-ray source while simultaneously measuring the kinetic energy of the electrons emitted from the sample using an electron analyser. Due to the surface sensitive nature of the technique, an in-situ surface clean is achieved by exposing the sample surface to argon ions generated by an argon gun. Research areas include development of next generation electronics, drug development, photovoltaics and catalysis.
Timeline
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Tender Regions
CPV Codes
38433100 - Mass spectrometer
38434000 - Analysers
38000000 - Laboratory, optical and precision equipments (excl. glasses)
35312000 - Gas guns
38433000 - Spectrometers
33114000 - Spectroscopy devices
33111000 - X-ray devices
38582000 - X-ray inspection equipment
38947000 - X ray microanalysers
38434510 - Cytometers
38580000 - Non-medical equipment based on the use of radiations
38500000 - Checking and testing apparatus
38900000 - Miscellaneous evaluation or testing instruments
38434560 - Chemistry analyser
Keywords
X-ray devices
radiographic machines
X-ray equipment
diagnostic X-ray units
spectroscopy devices
spectrometers
spectral analysis equipment
optical spectroscopy instruments
gas guns
tear gas guns
stun gas guns
pepper spray guns
non-lethal gas weapons
riot control gas guns
laboratory instruments
precision apparatus
scientific measuring devices
analytical equipment
optical tools
research lab gear
calibration instruments
microscopy tools
spectrometry units
light analyzers
mass spectrometers
emission spectrometers
optical spectrometers
portable spectrometers
UV‑Vis spectrometers
Raman spectrometers
MS analyzers
mass-to-charge analyzers
mass spec units
high-resolution mass spectrometers
tandem MS systems
analysers
chemical analysers
lab analysis devices
process analysers
fluid analysers
sample investigation tools
component analysers
cytometers
flow cytometers
cell analysis systems
fluorescence cytometers
lab cell counters
cell sorting cytometers
immunophenotyping cytometers
chemistry analyser
reagent chemistry systems
metabolic panel analysers
automated chemical analysis instruments
photometric chemistry analyzers
testing equipment
quality inspection tools
measurement devices
calibration systems
laboratory testers
compliance testing apparatus
fault detection instruments
industrial X‑ray units
baggage scanners
security scanners
non-destructive testing radiology
cargo X‑ray systems
radiation imaging devices
X‑ray inspection systems
industrial X‑ray testers
material inspection X‑ray units
weld inspection machines
X‑ray flaw detectors
general testing equipment
multipurpose lab instruments
evaluation tools
diagnostic devices
measurement apparatus
X-ray microanalysers
microprobe analyzers
electron beam X-ray instruments
elemental mapping devices
micro-XRF spectrometers
trace element analyzers
energy dispersive systems
X-ray microscopy tools
nanoscale chemical analysis equipment
Tender Lot Details
2 Tender Lots
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