Awarded
Plasma Focused Ion Beam and Gallium Focused Ion Beam Microscopes
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Descriptions
The IAC at UoB has identified a need to procure a Plasma-Focused Ion Beam (PFIB) system, which allows for:• Dual-beam capability with field emission gun scanning electron microscopy (FEGSEM) and plasma-based focused ion beam,• Micromachining with ....See More
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CPV Codes
38512100 - Ion microscopes
Keywords
ion microscopes
ion optics devices
ion beam imaging systems
high-energy particle microscopes
surface analysis microscopes
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