Awarded
Procurement of Critical Point Drier
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Descriptions
The purpose of this tender is to procure the supply and install of a critical point drier for use in the scientific laboratories at the National Museums Collection Centre in Granton, Edinburgh. The specifications and requirements are detailed in the attached tender documents.
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Tender Regions
CPV Codes
38511100 - Scanning electron microscopes
Keywords
SEM devices
high-vacuum imaging units
scanning electron microscopes
electron scan microscopes
surface morphology analyzers
microstructure inspection systems
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