Awarded

Semiconductor Lifetest Equipment

Descriptions

NPL and the University of Glasgow will work together to establish a service for Burn-in and Life-testing of semiconductor laser diodes in high-volume for manufacturers and suppliers of laser diodes.The requirements for such a system are as follows:Essential:•TO46, TO3, TO5, TO8, TO9 package compatibility in volumes up to 200 per month for burn-in and 100 devices for life-test per month•Life-test duration > 10,000 hours•Burn in / Life-test temperature from Ambient to 150degC with independent heaters in each module•Maximum bias up to 1A on TO3 and TO8 package, and Chip-on-carrier (CoC)•Bar test – Typical bar with dimensions 30 mm long and up to 10 mm wide, with 100 devices across. All the devices on the bar will require burn-in. At least 10 devices on each bar will need life-test.•Optical detector to monitor light output of each device under test•Wavelength range from 400 nm – 1600 nm•Temperature sensor at each device for close monitoring•Independent current drive for each device•Adaptable/re-configurable bar-test, CoC layout and # of pins on TO-packages for future “non-standard” testing requests•Low noise, highly stable current driver for each device ( 1degC)•Remote access to monitor and control system software

Timeline

Published Date :

20th Jan 2023 2 years ago

Deadline :

N/A

Tender Awarded :

1 Supplier

Awarded date :

19th Jan 2023

Contract Start :

N/A

Contract End :

N/A

Tender Regions

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Workflows

Status :

Awarded

Assign to :

Tender Progress :

0%

Details

Notice Type :

Open opportunity

Tender Identifier :

IT-378-246-T: 2024 - 001

TenderBase ID :

310724019

Low Value :

£100K

High Value :

£1000K

Region :

North Region

Attachments :

Buyer Information

Address :

Liverpool Merseyside , Merseyside , L13 0BQ

Website :

N/A

Procurement Contact

Name :

Tina Smith

Designation :

Chief Executive Officer

Phone :

0151 252 3243

Email :

tina.smith@shared-ed.ac.uk

Possible Competitors

1 Possible Competitors