Awarded
Supply, Delivery, Installation of Scanning Acoustic Microscopy equipment
Descriptions
NMIS require C-SAM (scanning acoustic microscope) capability. C-SAM is required to non-destructively inspect work-pieces at various stages of our semiconductor packaging process. We require a machine that can accept samples approximately 500 x 500 mm and is suitable for use in a semiconductor manufacturing context to detect delamination and other structural discontinuities in semiconductor packages. Machine outputs should include high resolution C-Scan images, and possibly A- and B- scan images.
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CPV Codes
38510000 - Microscopes
Tender Lot Details
1 Tender Lot
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Possible Competitors
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