Awarded
Thermo-Fisher (FEI) Electron Microscope Service Contract
Descriptions
Annual Service Agreement for selected Thermo-Fisher (FEI) instrumentation for the period 20.06.24-19.06.25.
Instruments included on contract are Inspect F SEM (Secure), Inspect F50 SEM (Secure), Helios G3 FIB (secure).
Timeline
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Tender Regions
CPV Codes
38511100 - Scanning electron microscopes
Keywords
scanning electron microscopes
SEM devices
surface morphology analyzers
high-vacuum imaging units
electron scan microscopes
microstructure inspection systems
Tender Lot Details
2 Tender Lots
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Possible Competitors
1 Possible Competitors