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3D Inspection and Imaging System
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Descriptions
3D Inspection and Imaging System
Timeline
Published Date :
Deadline :
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Contract End :
Tender Regions
CPV Codes
38514100 - Darkfield microscopes
38512000 - Ion and molecular microscopes
38515100 - Polarizing microscopes
38518100 - Wide field microscopes
38511100 - Scanning electron microscopes
38510000 - Microscopes
38514000 - Darkfield and scanning probe microscopes
38515000 - Fluorescent and polarizing microscopes
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Details
Buyer Information
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Possible bidding competitors
Possible bidding competitors