Laser Diode Accelerated Lifetest

Descriptions

The compound semiconductor applications catapult is looking to create a modular, flexible, accelerated life test system for photonics components and devices to determine lifetime and reliability of prototypes. The service provided is intended to de-risk photonics products and identify potential failure modes. The system could potentially be used for low volume burn-in of pilot line products.The system shall be adaptable to test a variety of components from chip level through to COS (Chip on Submount) and custom optoelectronic packaged modules. The system will be located in the CSA Catapult’s innovation centre, within the evaluation laboratory, which will be equipped with access to process cooled water and a number of 3 phase power supplies.The system shall be able to accommodate a range of devices simultaneously whilst delivering different operating conditions with respect to drive current and heat sink temperature.The catapult may also purchase additional related services.