Closed
Plasma FIB
Descriptions
Plasma FIB. Technical information is provided.
Timeline
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Tender Regions
CPV Codes
38511100 - Scanning electron microscopes
38511000 - Electron microscopes
Keywords
electron microscopes
high-resolution microscopes
electron beam imaging systems
EM devices
nanoscale imaging tools
submicron structure analyzers
scanning electron microscopes
SEM devices
surface morphology analyzers
high-vacuum imaging units
electron scan microscopes
microstructure inspection systems
Tender Lot Details
2 Tender Lots
Workflows
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Details
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Buyer Information
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Possible Competitors
1 Possible Competitors
