Closed
Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester
Request tender documents
Save your time. You just request and we will send you the available (ITT/RFP/RFQ/PQQ/SQ) documents.
Request for bid service
Save your time. You just request and we will arrange tender related all available documents to bid writers for the best possible quote.
Descriptions
The University of Warwick has a requirement to purchase a Dynamic Reliability & Robustness Power Characterisation Tester designed for testing wide bandgap (SiC and GaN) power semiconductor device. In order to express interest in this opp ....see more
Timeline
Published Date :
Deadline :
Contract Start :
Contract End :
Tender Regions
Tender Lot Details & Award Criteria
1 Tender Lots
Workflows
Status :
Details
Buyer Information
Name :
Procurement Contact
Name :
Phone :
Email :