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Plasma FIB
Descriptions
Plasma FIB. Technical information is provided.see more
Timeline
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Tender Regions
CPV Codes
38511100 - Scanning electron microscopes
38511000 - Electron microscopes
Keywords
SEM devices
EM devices
nanoscale imaging tools
electron microscopes
high-resolution microscopes
high-vacuum imaging units
electron beam imaging systems
scanning electron microscopes
electron scan microscopes
surface morphology analyzers
submicron structure analyzers
microstructure inspection systems
Workflows
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Details
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Buyer Information
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